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期刊


ISSN0097-966X
刊名SID International Symposium
参考译名信息显示学会国际会议技术论文辑要
收藏年代2005～2022



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2013, vol.44, no.1 2013, vol.44, no.2 2013, vol.44, no.3

题名作者出版年年卷期
High Uniformity Solid Phase Crystallized Bridged-Grain Polycrystalline Silicon Thin Film TransistorsWei Zhou; Rongsheng Chen; Shuyun Zhao; Meng Zhang; Man Wong; Hoi Sing Kwok20132013, vol.44, no.3
An Integrated a-Si:H Gate Driver Circuit Design for Large-sized TFT-LCD ApplicationsChih-Lung Lin; Mao-Hsun Cheng; Chia-En Wu; Chun-Da Tu20132013, vol.44, no.3
New Pixel Structure with High G-to-G Response Time for Large Size and High Resolution OLED TVsJoong-Sun Yoon; Byoung-Wook Kang; Hong-Jae Shin; Bum-Sik Kim; Chang-Ho Oh; Byung-Chul Ahn20132013, vol.44, no.3
Trap States in Amorphous In-Sn-Zn-O Thin-Film Transistors Analyzed Using Dependence on Channel ThicknessTokiyoshi Matsuda; Mutsumi Kimura; Jingxin Jiang; Dapeng Wang; Mamoru Furuta; Masashi Kasami; Shigekazu Tomai; Koki Yano20132013, vol.44, no.3
Power-Saving Sunlight Readable TFT LCDsYao-Dong Ma20132013, vol.44, no.3
Recognition of Existence of n-type IGZO Layer in CAAC-IGZO Film under Source and Drain Electrode Made of TungstenRyo Tokumaru; Masashi Tsubuku; Yasumasa Yamane; Takayuki Inoue; Tetsuhiro Tanaka; Daisuke Matsubayashi; Hideomi Suzawa; Shunpei Yamazaki; Yasutaka Nakazawa; Masami Jintyou; Hiroshi Matsukizono; Akihiro Oda; Shigeyasu Mori; Takuya Matsuo20132013, vol.44, no.3
Development of Post-annealing Method for Flexible Oxide TFTs ApplicationChur-Shyang Fuh; Po-Tsun Liu; Li-Feng Teng; Yang-Shun Fan; Chih-Hsiang Chang; Yu-Ta Wu; Sih-Wei Huang; Han-Ping D. Shieh20132013, vol.44, no.3
Rollable a-IGZO Thin Film Transistors with Nanocomposite Dielectric on PEN SubstrateHsin-Cheng Lai; Jyun-Ruei Jian; Zingway Pei20132013, vol.44, no.3
Separate Extraction Technique for Intrinsic Donor- and Acceptor-like Density-of-States over Full-Energy Range Sub-Bandgap in Amorphous Oxide Semiconductor Thin Film Transistors by Using One-Shot Monochromatic Photonic Capacitance-Voltage CharacteristicsHagyoul Bae; Sungwoo Jun; Hyunjun Choi; Chunhyung Jo; Yun Hyeok Kim; Jun Seok Hwang; Jaeyeop Ahn; Sung-Jin Choi; Dae Hwan Kim; Dong Myong Kim20132013, vol.44, no.3
Influence of Photo-Thermal Pre-treatment on Electrical Characteristics and Reliability of Zn-Sn-O Thin-Film TransistorsYu-Chun Chen; Ting-Chang Chang; Hung-Wei Li; Tien-Yu Hsieh; Wan-Fang Chung20132013, vol.44, no.3
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