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期刊


ISSN0097-966X
刊名SID International Symposium
参考译名信息显示学会国际会议技术论文辑要
收藏年代2005～2022



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2022, vol.53, no.1 2022, vol.53, no.2 2022, vol.53, no.3

题名作者出版年年卷期
Analyzing the Degradation Process of Quantum-Dot LEDs (QLEDs) by Mass SpectrometryHin-Wai Mo; Daichi Shirakura; Kentaro Harada; Kiyoshi Ishibashi; Takahiro Shibamori; Takashi Miyamoto; Chihaya Adachi20222022, vol.53, no.1
All Inkjet-printed RGB Cd-free EL-QD Devices with Top-emission StructureMyoungjin Park; Young II Kim; Jin-goo Kang; Sehun Kim; Jaekook Ha; Yeo-geon Yoon; Changhee Lee20222022, vol.53, no.1
Highly Efficient Green Top-Emission Light-Emitting Diodes Based on Indium-Phosphide Quantum DotsDi Zhang; Dong Li; Jingwen Feng; Youqin Zhu; Zhuo Chen; Yanzhao Li; Xinguo Li; Xiaoguang Xu20222022, vol.53, no.1
Development of Ultra-Large 95inch 8K 120Hz OLED DisplayZhongyuan Wu; Yongqian Li; Liangchen Yan; Lankai Ye; Yuqing Peng; Huaiting Shih; Jianwei Yu; Xue Dong20222022, vol.53, no.1
High-Performance, Coplanar Polycrystalline InGaO Thin-Film Transistor for Large-Area, High-Resolution AMOLED DisplayHasnat Rabbi; Suhui Lee; Daich Sasaki; Emi Kawashima; Yuki Tsuruma; Jin Jang20222022, vol.53, no.1
High Mobility Oxide Thin-film Transistors for AMOLED DisplaysJoon Seok Park; Jun Hyung Lim20222022, vol.53, no.1
Implementation of Full-Panel Circuit Models for Interference Estimation Between Touch and Display Operation in On-Cell Touch AMOLEDSeung-Hun Choi; Jun-Yeol An; Jae-Youl Lee; Si-Woo Kim; Hyung-Min Lee; Yoon-Kyung Choi20222022, vol.53, no.1
Tracing-Based Degradation Estimation Method for Stress-Profile AlgorithmSeokah Hong; Joonchul Goh; Jaesung Bae; Dongjoon Kwag; Hyeongjin Kim; Wonjun Choe20222022, vol.53, no.1
A Random Access Gate Driver Using a-IGZO TFTs for External Compensation of High-Resolution, High-Frame-Rate AMOLEDsYong-Duck Kim; Ki-Lim Han; Jin-Seong Park; Byong-Deok Choi20222022, vol.53, no.1
Tutorial on Diffractive Liquid-Crystal Devices for AR/VR DisplaysKun Yin; Junyu Zou; Yannanqi Li; Tiegang Lin; Shin-Tson Wu20222022, vol.53, no.1
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