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期刊


ISSN0018-9456
刊名IEEE Transactions on Instrumentation and Measurement
参考译名IEEE测试设备与测量汇刊
收藏年代1998～2013

关联期刊参考译名收藏年代
IEEE Transactions on Instrumentation and MeasurementIEEE测试设备与测量汇刊 


全部

1998 1999 2000 2001 2002 2003
2004 2005 2006 2007 2008 2009
2010 2011 2012 2013

2001, vol.50, no.1 2001, vol.50, no.2 2001, vol.50, no.3 2001, vol.50, no.4 2001, vol.50, no.5 2001, vol.50, no.6

题名作者出版年年卷期
The relationship between microsystem technology and metrologyReinoud F. Wolffenbuttel; Cees J. van Mullem20012001, vol.50, no.6
IC fabrication-compatible processing for instrumentation and measurement applicationsDavey D. L. Wijngaards; Reinoud F. Wolffenbuttel20012001, vol.50, no.6
Testing of microanalysis systemHans G. Kerkhoff20012001, vol.50, no.6
Development of thin-film multijunction thermal converters at PTB/IPHTManfred Klonz; Hector Laiz; Ernst Kessler20012001, vol.50, no.6
Stability of microelectromechanical devices for electrical metrologyJukka Kyynarainen; Aarne S. Oja; Heikki Seppa20012001, vol.50, no.6
Micromechanical voltage reference using the pull-in of a beamEdmond Cretu; Luis Alexandre Rocha; Reinoud F. Wolffenbuttel20012001, vol.50, no.6
Bulk micromachined electrostatic RMS-to-DC converterGer de Graaf; Marian Bartek; Z. Xiao; Cees J. van Mullem; Reinoud F. Wolffenbuttel20012001, vol.50, no.6
Nanotechnology for next generation Josephson voltage standardsSamuel P. Benz; Paul D. Dresselhaus; Charles J. Burroughs, Jr.20012001, vol.50, no.6
A silicon-etched probe for 3-D coordinate measurements with an uncertainty below 0.1 μmHan Haitjema; Wouter Pril; P. H. J. Schellekens20012001, vol.50, no.6
Low-cost satellite attitude control sensors based on integrated infrared detector arraysA. W. van Herwaarden20012001, vol.50, no.6
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