中国机械工程学会生产工程分会知识服务平台

期刊


ISSN0018-9456
刊名IEEE Transactions on Instrumentation and Measurement
参考译名IEEE测试设备与测量汇刊
收藏年代1998～2013

关联期刊参考译名收藏年代
IEEE Transactions on Instrumentation and MeasurementIEEE测试设备与测量汇刊 


全部

1998 1999 2000 2001 2002 2003
2004 2005 2006 2007 2008 2009
2010 2011 2012 2013

2005, vol.54, no.1 2005, vol.54, no.2 2005, vol.54, no.3 2005, vol.54, no.4 2005, vol.54, no.5 2005, vol.54, no.6

题名作者出版年年卷期
Getting Errors to Catch Themselves-Self-Testing of VLSI Circuits With Built-in HardwareSunil R. Das20052005, vol.54, no.3
Embedded Test Control Schemes Using iBIST for SOCsDouglas Kay; Sung Chung; Samiha Mourad20052005, vol.54, no.3
Built-in Online and Offline Test of Airborne Digital SystemsJacob Savir20052005, vol.54, no.3
Special Issue on BIT CMOS Built-in Test Architecture for High-Speed Jitter MeasurementKaren A. Taylor; Bryan Nelson; Alan Chong; Henry Lin; Eddie Chan; Mani Soma; Hosam Haggag; Jeff Huard; Jim Braatz20052005, vol.54, no.3
A Built-in-Test Scheme for Evaluating the Parameters of Floating-Gate MOS TransistorsAn Sang Hou20052005, vol.54, no.3
Built-in Self-Test for Phase-Locked LoopsChun-Lung Hsu; Yiting Lai; Shu-Wei Wang20052005, vol.54, no.3
A Bayesian Approach to Diagnosis and Prognosis Using Built-in TestJohn W. Sheppard; Mark A. Kaufman20052005, vol.54, no.3
Effective Simulation of Signals for Testing ECG AnalyzerAdam Josko; Remigiusz J. Rak20052005, vol.54, no.3
A Chirp-Z Transform-Based Synchronizer for Power System MeasurementsMassimo Aiello; Antonio Cataliotti; Salvatore Nuccio20052005, vol.54, no.3
Automated Selection of Test Frequencies for Fault Diagnosis in Analog Electronic CircuitsCesare Alippi; Marcantonio Catelani; Ada Fort; Marco Mugnaini20052005, vol.54, no.3
12345



国家科技图书文献中心  全球文献资源网  京ICP备05055788号-26  机械工业信息研究院 2018-2024