中国机械工程学会生产工程分会知识服务平台

期刊


ISSN1043-7398
刊名Journal of Electronic Packaging
参考译名电子封装杂志;美国机械工程师学会汇刊
收藏年代1995~2024



全部

1995 1996 1997 1998 1999 2000
2001 2002 2003 2004 2005 2006
2007 2008 2009 2010 2011 2012
2013 2014 2015 2016 2017 2018
2019 2020 2021 2022 2023 2024

2003, vol.125, no.1 2003, vol.125, no.2 2003, vol.125, no.3 2003, vol.125, no.4

题名作者出版年年卷期
Effect of Bonding Force on the Conducting Particle With Different SizesN. H. Yeung; Y. C. Chan; C. W. Tan20032003, vol.125, no.4
3D Nonlinear Stress Analysis of Tin Whisker Initiation on Lead-Free ComponentsJohn H. Lau; Stephen H. Pan20032003, vol.125, no.4
Mechanical and Electrical Properties of Au-Al and Cu-Al Intermetallics Layer at Wire Bonding InterfaceTan Chee Wei; Abdul Razak Daud20032003, vol.125, no.4
Electrical Conductive Characteristics of Anisotropic Conductive Adhesive ParticlesG. B. Dou; Y. C. Chan; Johan Liu20032003, vol.125, no.4
Thermal Stress and Deflection Analysis of a Glass Window (Circular Plate) Elastically Restrained Along its Edge in a Photonic DeviceJohn H. Lau; Steve Erasmus; Yida Zou20032003, vol.125, no.4
Maskless Process for Fabrication of Ultra-Fine Pitch Solder Bumps for Flip Chip InterconnectsR. T. P. Lee; A. S. Zuruzi; S. K. Lahiri20032003, vol.125, no.4
Impact of Die Attach Material and Substrate Design on RF GaAs Power Amplifier Devices Thermal PerformanceVictor Adrian Chiriac; Tien-Yu Tom Lee20032003, vol.125, no.4
Solders Fatigue Prediction Using Interfacial Boundary Volume CriterionX. J. Zhao; G. Q. Zhang; J. F. J. M. Caers; L. J. Ernst20032003, vol.125, no.4
Micro to Macro Thermo-Mechanical Simulation of Wafer Level PackagingChang-An Yuan; Kou-Ning Chiang20032003, vol.125, no.4
Numerical Simulation of Delamination in IC Packages Using a New Variable-Order Singular Boundary ElementA. A. O. Tay; K. H. Lee; K. M. Lim20032003, vol.125, no.4
123456789