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期刊


ISSN1084-4309
刊名ACM Transactions on Design Automation of Electronic Systems
参考译名ACM电子系统自动化设计汇刊
收藏年代2000～2024



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2000 2001 2002 2003 2004 2005
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2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2015, vol.20, no.1 2015, vol.20, no.2 2015, vol.20, no.3 2015, vol.20, no.4

题名作者出版年年卷期
Single-Event Multiple-Transient Characterization and Mitigation via Alternative Standard Cell Placement MethodsKiddie, Bradley T.; Robinson, William H.; Limbrick, Daniel B.20152015, vol.20, no.4
Introduction to the Special Issue on Reliable, Resilient, and Robust Design of Circuits and SystemsXie, Yuan; Bahar, R. Iris; Jones, Alex K.20152015, vol.20, no.4
Built-In Self-Test and Test Scheduling for Interposer-Based 2.5D ICWang, Ran; Chakrabarty, Krishnendu; Bhawmik, Sudipta20152015, vol.20, no.4
FOLD: Extreme Static Test Compaction by Folding of Functional Test SequencesPomeranz, Irith20152015, vol.20, no.4
Fast Simulation of Networks-on-Chip with Priority-Preemptive ArbitrationIndrusiak, Leandro Soares; Harbin, James; Dos Santos, Osmar Marchi20152015, vol.20, no.4
Architecting the Last-Level Cache for GPUs using STT-RAM TechnologySamavatian, Mohammad Hossein; Arjomand, Mohammad; Bashizade, Ramin; Sarbazi-Azad, Hamid20152015, vol.20, no.4
Implementing an Application-Specific Instruction-Set Processor for System-Level Dynamic Program Analysis EnginesHeo, Ingoo; Kim, Minsu; Lee, Yongje; Choi, Changho; Lee, Jinyong; Kang, Brent Byunghoon; Paek, Yunheung20152015, vol.20, no.4
Accurate Analysis and Prediction of Enterprise Service-Level PerformanceDuan, Qing; Koneru, Abhishek; Zeng, Jun; Chakrabarty, Krishnendu; Dispoto, Gary20152015, vol.20, no.4
Use It or Lose It: Proactive, Deterministic Longevity in Future Chip MultiprocessorsKim, Hyungjun; Boga, Siva Bhanu Krishna; Vitkovskiy, Arseniy; Hadjitheophanous, Stavros; Gratz, Paul V.; Soteriou, Vassos; Michael, Maria K.20152015, vol.20, no.4
Impact of Cell Failure on Reliable Cross-Point Resistive Memory DesignYu, Shimeng; Xie, Yuan; Xu, Cong; Niu, Dimin; Zheng, Yang20152015, vol.20, no.4
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