中国机械工程学会生产工程分会知识服务平台

期刊


ISSN1084-4309
刊名ACM Transactions on Design Automation of Electronic Systems
参考译名ACM电子系统自动化设计汇刊
收藏年代2000～2023



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2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023

2003, vol.8, no.1 2003, vol.8, no.2 2003, vol.8, no.3 2003, vol.8, no.4

题名作者出版年年卷期
A Multiple Bit Upset Tolerant SRAM MemoryGUSTAVO NEUBERGER; FERNANDA DE LIMA; LUIGI CARRO; RICARDO REIS20032003, vol.8, no.4
A Data Acquisition Methodology for On-Chip Repair of Embedded MemoriesDIRK NIGGEMEYER; ELIZABETH M. RUDNICK20032003, vol.8, no.4
A Circuit Level Fault Model for Resistive BridgesZHUO LI; XIANG LU; WANGQI QIU; WEIPING SHI; D. M. H. WALKER20032003, vol.8, no.4
BIST and Production Testing of ADCs Using Imprecise StimulusKUMAR PARTHASARATHY; TURKER KUYEL; DANA PRICE; LE JIN; DEGANG CHEN; RANDALL GEIGER20032003, vol.8, no.4
Testing High-Performance Pipelined Circuits with Slow-Speed TestersMUHAMMAD NUMMER; MANOJ SACHDEV20032003, vol.8, no.4
Multimode Scan: Test per Clock BIST for IP CoresADIT D.SINGH; MARKUS SEURING; MICHAEL GOSSEL; EGOR S. SOGOMONYAN20032003, vol.8, no.4
Test Data Compression Using Dictionaries with Selective Entries and Fixed-Length IndicesLEI LI; KRISHNENDU CHAKRABARTY;NURA.TOUBA20032003, vol.8, no.4
On Test Data Volume Reduction for Multiple Scan Chain DesignsSUDHAKAR M. REDDY; KOHEI MIYASE; SEIJI KAJIHARA; IRITH POMERANZ20032003, vol.8, no.4
Test Vector Decomposition-Based Static Compaction Algorithms for Combinational CircuitsAIMAN H. EL-MALEH; YAHYA E. OSAIS20032003, vol.8, no.4
SOC Test Architecture Design for Efficient Utilization of Test BandwidthSANDEEP KUMAR GOEL; ERIK JAN MARINISSEN20032003, vol.8, no.4
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