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期刊

ISSN	0913-5685
刊名	電子情報通信学会技術研究報告
参考译名	电子信息通信学会技术研究报告：可靠性
收藏年代	2000～2024

全部

2000	2001	2002	2003	2004	2005
2006	2007	2008	2009	2010	2011
2012	2013	2014	2015	2016	2017
2018	2019	2020	2021	2022	2023
2024

2015, vol.115, no.100	2015, vol.115, no.101	2015, vol.115, no.102	2015, vol.115, no.103	2015, vol.115, no.104	2015, vol.115, no.106
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2015, vol.115, no.88	2015, vol.115, no.9

题名	作者	出版年	年卷期
Experimental Study on Carrier Transport Properties in Extremely-Thin Body Ge-on-Insulator (GOI) p-MOSFETs with GOI Thickness down to 2 nm	Xiao Yu; Jian Kang; Mitsuru Takenaka; Shinichi Takagi	2015	2015, vol.115, no.440
ファンデルワールス接合の作製と量子輸送現象	町田友樹; 守谷頼; 佐田洋太; 山口健洋; 荒井美穂; 矢吹直人; 森川生; 増渕覚; 上野啓司	2015	2015, vol.115, no.440
Si上異種半導体集積によるCMOSフォトニクス	竹中充; 金栄現; 韓在勲; 亢健; 一宮佑希; 程勇鵬; 朴珍權; 金相賢; 高木信一	2015	2015, vol.115, no.440
最先端テクノロジノードにおける2RWデュアルポートSRAM設計事例	新居浩二; 薮内誠; 横山佳巧; 石井雄一郎; 岡垣健; 森本薫夫; 塚本康正; 田中浩司; 田中美紀; 田中信二	2015	2015, vol.115, no.440
次世代垂直磁化MTJを用いた高速·低消費電力のキャッシュメモリ階層技術を持つノーマリーオフプロセッサ	池上一隆; 野口紘希; 高谷聡; 鎌田親義; 天野実; 安部恵子; 櫛田桂一; 北川英二; 落合隆夫; 下村尚治; 才田大輔; 川澄篤; 原浩幸; 伊藤順一; 藤田忍	2015	2015, vol.115, no.440
極低ドレイン電圧で急峻なS値を持つPN-Body Tied SOI FET	井田次郎	2015	2015, vol.115, no.440
Advanced SPCプロセスにより形成された高移動度poly-Siナノワイヤトランジスタにおける電気輸送特性	小田穣; 佐久間究; 上牟田雄一; 齋藤真澄	2015	2015, vol.115, no.440
トンネルトランジスタにおけるBTIの理解	水林亘; 森貴洋; 福田浩一; 石川由紀; 森田行則; 右田真司; 太田裕之; 柳永勛; 大内真一; 塚田順一; 山内洋美; 松川貴; 昌原明植; 遠藤和彦	2015	2015, vol.115, no.440