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期刊
ISSN
0923-8174
刊名
Journal of Electronic Testing
参考译名
电子测试杂志:理论与应用
收藏年代
2000~2024
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2017, vol.33, no.1
2017, vol.33, no.2
2017, vol.33, no.3
2017, vol.33, no.4
2017, vol.33, no.5
2017, vol.33, no.6
题名
作者
出版年
年卷期
Guest Editorial: Analog, Mixed-Signal and RF Testing
Barragan, Manuel J.; Eisenstadt, William R.
2017
2017, vol.33, no.3
An ATE Filter Characterization ToolKit Using a Discrete Chirped Excitation Signal as Stimulus
Sarson, Peter
2017
2017, vol.33, no.3
Using Distortion Shaping Technique to Equalize ADC THD Performance Between ATEs
Sarson, Peter; Kobayashi, Haruo
2017
2017, vol.33, no.3
Special Issue on Analog, Mixed-Signal and RF Testing
Agrawal, Vishwani D.
2017
2017, vol.33, no.3
ADC Spectral Testing with Signal Amplitude Drift and Simultaneous Non-coherent Sampling
Zhuang, Yuming; Chen, Degang
2017
2017, vol.33, no.3
Multi-Directional Space Tessellation to Improve the Decision Boundary in Indirect Mixed-Signal Testing
Gomez-Pau, Alvaro; Balado, Luz; Figueras, Joan
2017
2017, vol.33, no.3
Fault Diagnosis of Smart Grid Distribution System by Using Smart Sensors and Symlet Wavelet Function
Dhend, Mangal Hemant; Chile, Rajan Hari
2017
2017, vol.33, no.3
A New Test Point Selection Method for Analog Continuous Parameter Fault
Luo, Hui; Lu, Wei; Wang, Youren; Wang, Ling
2017
2017, vol.33, no.3
A Passive Authentication System Based on Optical Variable Nano/Micro-Structures
Patel, Jasbir N.; Jiang, Hao; Kaminska, Bozena
2017
2017, vol.33, no.3
New Calibration Technique of Contact-less Resonant Biosensor
Deluthault, Anthony; Kerzerho, Vincent; Bernard, Serge; Soulier, Fabien; Cauvet, Philippe
2017
2017, vol.33, no.3
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