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期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



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2017, vol.33, no.1 2017, vol.33, no.2 2017, vol.33, no.3 2017, vol.33, no.4 2017, vol.33, no.5 2017, vol.33, no.6

题名作者出版年年卷期
EditorialAgrawal, Vishwani D.20172017, vol.33, no.4
An Access Mechanism for Embedded Sensors in Modern SoCsHe, Miao (Tony); Tehranipoor, Mark20172017, vol.33, no.4
Hardware Trojan Detection Based on Logical TestingBazzazi, Amin; Shalmani, Mohammad Taghi Manzuri; Hemmatyar, Ali Mohammad Afshin20172017, vol.33, no.4
Grouped Genetic Algorithm Based Optimal Tests Selection for System with Multiple Operation ModesYang, ChengLin; Chen, Fang; Tian, Shulin20172017, vol.33, no.4
An Automatic Functional Coverage for Digital Systems Through a Binary Particle Swarm Optimization Algorithm with a Reinitialization MechanismMartinez-Cruz, Alfonso; Barron-Fernandez, Ricardo; Molina-Lozano, Heron; Ramirez-Salinas, Marco-Antonio; Villa-Vargas, Luis-Alfonso; Cortes-Antonio, Prometeo; Cheng, Kwang-Ting (Tim)20172017, vol.33, no.4
ACM: An Energy-Efficient Accuracy Configurable Multiplier for Error-Resilient ApplicationsGarg, Bharat; Sharma, G. K.20172017, vol.33, no.4
Test of Mechanical Failure for Via Holes and Solder Joints of Complex Interconnect StructureShang, Yuling; Sun, Liyuan; Li, Chunquan; Ma, Jianfeng20172017, vol.33, no.4
A New BIST-based Test Approach with the Fault Location Capability for Communication Channels in Network-on-ChipAghaei, Babak; Khademzadeh, Ahmad; Reshadi, Midia; Badie, Kambiz20172017, vol.33, no.4
Resistive Bridging Defect Detection in Bulk, FDSOI and FinFET TechnologiesKarel, Amit; Comte, Mariane; Galliere, Jean-Marc; Azais, Florence; Renovell, Michel20172017, vol.33, no.4
Built-In Fault Localization Circuitry for High Performance FPGA Based ImplementationsDhar, Anindya Sundar; Palchaudhuri, Ayan20172017, vol.33, no.4
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