中国机械工程学会生产工程分会知识服务平台

期刊


ISSN0913-5685
刊名電子情報通信学会技術研究報告
参考译名电子信息通信学会技术研究报告：可靠性
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2017, vol.117, no.10 2017, vol.117, no.101 2017, vol.117, no.102 2017, vol.117, no.104 2017, vol.117, no.111 2017, vol.117, no.120
2017, vol.117, no.121 2017, vol.117, no.125 2017, vol.117, no.138 2017, vol.117, no.14 2017, vol.117, no.140 2017, vol.117, no.141
2017, vol.117, no.142 2017, vol.117, no.143 2017, vol.117, no.144 2017, vol.117, no.145 2017, vol.117, no.147 2017, vol.117, no.148
2017, vol.117, no.149 2017, vol.117, no.155 2017, vol.117, no.16 2017, vol.117, no.161 2017, vol.117, no.166 2017, vol.117, no.167
2017, vol.117, no.17 2017, vol.117, no.170 2017, vol.117, no.171 2017, vol.117, no.177 2017, vol.117, no.18 2017, vol.117, no.188
2017, vol.117, no.190 2017, vol.117, no.191 2017, vol.117, no.192 2017, vol.117, no.193 2017, vol.117, no.194 2017, vol.117, no.195
2017, vol.117, no.202 2017, vol.117, no.203 2017, vol.117, no.208 2017, vol.117, no.216 2017, vol.117, no.218 2017, vol.117, no.223
2017, vol.117, no.224 2017, vol.117, no.225 2017, vol.117, no.226 2017, vol.117, no.227 2017, vol.117, no.229 2017, vol.117, no.23
2017, vol.117, no.235 2017, vol.117, no.244 2017, vol.117, no.245 2017, vol.117, no.25 2017, vol.117, no.251 2017, vol.117, no.253
2017, vol.117, no.254 2017, vol.117, no.255 2017, vol.117, no.259 2017, vol.117, no.260 2017, vol.117, no.264 2017, vol.117, no.265
2017, vol.117, no.268 2017, vol.117, no.27 2017, vol.117, no.270 2017, vol.117, no.272 2017, vol.117, no.273 2017, vol.117, no.275
2017, vol.117, no.276 2017, vol.117, no.285 2017, vol.117, no.29 2017, vol.117, no.290 2017, vol.117, no.291 2017, vol.117, no.292
2017, vol.117, no.30 2017, vol.117, no.300 2017, vol.117, no.302 2017, vol.117, no.311 2017, vol.117, no.312 2017, vol.117, no.327
2017, vol.117, no.328 2017, vol.117, no.332 2017, vol.117, no.333 2017, vol.117, no.337 2017, vol.117, no.339 2017, vol.117, no.34
2017, vol.117, no.341 2017, vol.117, no.342 2017, vol.117, no.343 2017, vol.117, no.344 2017, vol.117, no.347 2017, vol.117, no.349
2017, vol.117, no.35 2017, vol.117, no.355 2017, vol.117, no.356 2017, vol.117, no.358 2017, vol.117, no.36 2017, vol.117, no.366
2017, vol.117, no.369 2017, vol.117, no.37 2017, vol.117, no.373 2017, vol.117, no.375 2017, vol.117, no.377 2017, vol.117, no.39
2017, vol.117, no.394 2017, vol.117, no.398 2017, vol.117, no.399 2017, vol.117, no.400 2017, vol.117, no.406 2017, vol.117, no.407
2017, vol.117, no.408 2017, vol.117, no.409 2017, vol.117, no.41 2017, vol.117, no.413 2017, vol.117, no.415 2017, vol.117, no.420
2017, vol.117, no.427 2017, vol.117, no.428 2017, vol.117, no.429 2017, vol.117, no.430 2017, vol.117, no.431 2017, vol.117, no.435
2017, vol.117, no.437 2017, vol.117, no.438 2017, vol.117, no.441 2017, vol.117, no.448 2017, vol.117, no.454 2017, vol.117, no.455
2017, vol.117, no.461 2017, vol.117, no.462 2017, vol.117, no.463 2017, vol.117, no.467 2017, vol.117, no.470 2017, vol.117, no.478
2017, vol.117, no.482 2017, vol.117, no.483 2017, vol.117, no.487 2017, vol.117, no.488 2017, vol.117, no.492 2017, vol.117, no.494
2017, vol.117, no.497 2017, vol.117, no.498 2017, vol.117, no.499 2017, vol.117, no.502 2017, vol.117, no.503 2017, vol.117, no.505
2017, vol.117, no.509 2017, vol.117, no.515 2017, vol.117, no.519 2017, vol.117, no.59 2017, vol.117, no.60 2017, vol.117, no.61
2017, vol.117, no.62 2017, vol.117, no.66 2017, vol.117, no.7 2017, vol.117, no.70 2017, vol.117, no.81 2017, vol.117, no.9
2017, vol.117, no.90 2017, vol.117, no.91 2017, vol.117, no.92 2017, vol.117, no.96 2017, vol.117, no.97

题名作者出版年年卷期
［依頼講演］シンチレータと Ga_2O_3 半導体岡田豪; 臼井雄輝; 河野直樹; 河口範明; 柳田健之20172017, vol.117, no.101
ダイヤモンド中の窒素-空孔センターによる高感度センシング技術岩崎孝之; 波多野睦子20172017, vol.117, no.101
XPS による High-k／SiO_2 界面の化学構造およびダイポールの評価藤村信幸; 大田晃生; 池田弥央; 牧原克典; 宮崎誠一20172017, vol.117, no.101
定電圧および定電流印加による Si酸化薄膜の電気抵抗変化特性評価大田晃生; 加藤祐介; 池田弥央; 牧原克典; 宮崎誠一20172017, vol.117, no.101
分極接合基板上 p チャネル GaN MOS 構造の容量特性についての検討高山留美; 星井拓也; 中島昭; 西澤伸一; 大橋弘通; 角嶋邦之; 若林整; 筒井一生20172017, vol.117, no.101
高濃度 SOI 基板と転写法による TMDC FETs の作製川那子高暢; 居駒遼; 高木寛之; 小田俊理20172017, vol.117, no.101
Ge_(1-x)Sn_x ゲートスタック構造における欠陥の物性評価金田裕一; 池進一; 兼松正行; 坂下満男; 竹内和歌奈; 中塚理; 財満鎮明20172017, vol.117, no.101
エピタキシャル Ag（111）上の極薄 IV 族結晶形成伊藤公一; 大田晃生; 黒澤昌志; 洗平昌晃; 池田弥央; 牧原克典; 宮崎誠一20172017, vol.117, no.101
［依頼講演］SOI 技術を用いた量子イメージング検出器の開発－半導体で素粒子·X 線を見る新井康夫20172017, vol.117, no.101
［依頼講演］皮膚アセトン測定に向けた WO_3 ナノ粒子半導体式ガスセンサの研究山田祐樹; 檜山聡; 田畑仁20172017, vol.117, no.101



国家科技图书文献中心  全球文献资源网  京ICP备05055788号-26  京公网安备11010202008970号  机械工业信息研究院 2018-2024