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期刊

ISSN	0913-5685
刊名	電子情報通信学会技術研究報告
参考译名	电子信息通信学会技术研究报告：可靠性
收藏年代	2000～2024

全部

2000	2001	2002	2003	2004	2005
2006	2007	2008	2009	2010	2011
2012	2013	2014	2015	2016	2017
2018	2019	2020	2021	2022	2023
2024

2018, vol.118, no.1	2018, vol.118, no.10	2018, vol.118, no.102	2018, vol.118, no.104	2018, vol.118, no.11	2018, vol.118, no.110
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题名	作者	出版年	年卷期
［招待講演］Stress Investigation of Annular-Trench-Isolated （ATI） Through Silicon Via （TSV）	Wei FENG; Naoya WATANABE; Haruo SHIMAMOTO; Masahiro AOYAGI; Katsuya KIKUCHI	2018	2018, vol.118, no.438
［招待講演］めっき銅薄膜配線の機械特性とEM耐性の結晶粒界品質依存性	罗轶凡; 名越優太郎; 水野涼太; 鈴木研; 三浦英生	2018	2018, vol.118, no.438
［招待講演］微細CMOS向け新コンタクト材料：クラスター気相合成法で形成したSiリッチWシリサイド膜	岡田直也; 内田紀行; 小川真一; 金山敏彦	2018	2018, vol.118, no.438
［招待講演］ナノインプリントによるハーフピッチ14nm直接パターニング	中杉哲郎	2018	2018, vol.118, no.438
［招待講演］p型GaN上に形成した単結晶Al配線およびそのGaN FETへの応用	原田剛史; 宇高孝二; 神田裕介; 大西克彦; 松永啓一; 引田正洋; 上本康裕	2018	2018, vol.118, no.438
［招待講演］誘導自己組織化による極微細三次元配線形成技術	福島誉史; マリアッパンムルゲサン; 小柳光正	2018	2018, vol.118, no.438
平滑なAuナノ薄膜を有する大気中にて常温接合可能な基板作製技術	松前貴司; 山本道貴; 倉島優一; 日暮栄治; 高木秀樹	2018	2018, vol.118, no.438