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期刊


ISSN1084-4309
刊名ACM Transactions on Design Automation of Electronic Systems
参考译名ACM电子系统自动化设计汇刊
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2021, vol.26, no.1 2021, vol.26, no.2 2021, vol.26, no.3 2021, vol.26, no.4 2021, vol.26, no.5 2021, vol.26, no.6

题名作者出版年年卷期
Logic Diagnosis with Hybrid Fail DataPomeranz, Irith; Amyeen, M. Enamul20212021, vol.26, no.3
COPE: Reducing Cache Pollution and Network Contention by Inter-tile Coordinated Prefetching in NoC-based MPSoCsDeb, Dipika; Jose, John; Palesi, Maurizio20212021, vol.26, no.3
Machine Learning for Statistical Modeling: The Case of Perpendicular Spin-Transfer-Torque Random Access MemoryRoy, Urmimala; Pramanik, Tanmoy; Roy, Subhendu; Chatterjee, Avhishek; Banerjee, Sanjay K.; Register, Leonard F.20212021, vol.26, no.3
Approximate Learning and Fault-Tolerant Mapping for Energy-Efficient Neuromorphic SystemsGebregirogis, Anteneh; Tahoori, Mehdi20212021, vol.26, no.3
Multi-objective Optimization of Mapping Dataflow Applications to MPSoCs Using a Hybrid Evaluation Combining Analytic Models and MeasurementsLetras, Martin; Falk, Joachim; Schwarzer, Tobias; Teich, Juergen20212021, vol.26, no.3
Fault-based Built-in Self-test and Evaluation of Phase Locked LoopsInce, Mehmet; Yilmaz, Ender; Fu, Wei; Park, Joonsung; Nagaraj, Krishnaswamy; Winemberg, Leroy; Ozev, Sule20212021, vol.26, no.3
MaxSense: Side-channel Sensitivity Maximization for Trojan Detection Using Statistical Test PatternsMishra, Prabhat; Lyu, Yangdi20212021, vol.26, no.3
Covering Test Holes of Functional Broadside TestsPomeranz, Irith20212021, vol.26, no.3



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