中国机械工程学会生产工程分会知识服务平台

期刊


ISSN1043-7398
刊名Journal of Electronic Packaging
参考译名电子封装杂志;美国机械工程师学会汇刊
收藏年代1995~2024



全部

1995 1996 1997 1998 1999 2000
2001 2002 2003 2004 2005 2006
2007 2008 2009 2010 2011 2012
2013 2014 2015 2016 2017 2018
2019 2020 2021 2022 2023 2024

2021, vol.143, no.1 2021, vol.143, no.2 2021, vol.143, no.3 2021, vol.143, no.4

题名作者出版年年卷期
Development and Application of a Thin Flat Heat Pipe Design Optimization Tool for Small Satellite SystemsIsaacs, Steven A.; Lapointe, Caelan; Hamlington, Peter E.20212021, vol.143, no.1
An Overview of Thermal and Mechanical Design, Control, and Testing of the World's Most Powerful and Fastest SupercomputerYuksel, Anil; Mahaney, Vic; Marroquin, Chris; Tian, Shurong; Hoffmeyer, Mark; Schultz, Mark; Takken, Todd20212021, vol.143, no.1
A New Correlation for Subcooled Flow Boiling Heat Transfer in a Vertical Narrow MicrochannelChen, Zengchao; Li, Wei; Li, Junye; Zhou, Kan; Feng, Zhaozan20212021, vol.143, no.1
Fatigue Properties and Microstructure of SnAgCu Bi-Based Solder JointJian, Minghong; Su, Sinan; Hamasha, Sa'd; Hamasha, Mohammad M.; Alkhazali, Atif20212021, vol.143, no.1
Thermal Performance of Metal Foam Heat Sink With Pin Fins for Nonuniform Heat Flux Electronics CoolingLi, Yongtong; Gong, Liang; Xu, Minghai; Joshi, Yogendra20212021, vol.143, no.1
Thermal Analysis and Optimization of Light-Emitting Diodes Filament LampLiu, Jie; Zou, Jinglong; Liu, Sheng20212021, vol.143, no.1
Principal Component Analysis and Independent Component Analysis-Based Prognostic Health Monitoring of Electronic Assemblies Subjected to Simultaneous Temperature-Vibration LoadsLall, Pradeep; Thomas, Tony20212021, vol.143, no.1
Detection of Sealant Delamination in Integrated Circuit Package Using Nondestructive EvaluationLi, Guoyi; Lee, Hyunseong; Chattopadhyay, Aditi; Kumar Neerukatti, Rajesh; Liu, Kuang C.20212021, vol.143, no.1
Effects of High-Temperature Storage on the Glass Transition Temperature of Epoxy Molding CompoundLi, Ruifeng; Yang, Daoguo; Zhang, Ping; Niu, Fanfan; Cai, Miao; Zhang, G. Q.20212021, vol.143, no.1
Interfacial Behavior of Flux Residues and Its Impact on Copper/Underfill Adhesion in Microelectronic PackagingAndre, John S.; Ji, Karen; Chen, Zhan; Ulrich, Nathan20212021, vol.143, no.1
12