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期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



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2018 2019 2020 2021 2022 2023

2023, vol.39, no.1 2023, vol.39, no.2 2023, vol.39, no.3 2023, vol.39, no.4 2023, vol.39, no.5/6

题名作者出版年年卷期
2022 JETTA-TTTC Best Paper Award 20232023, vol.39, no.5/6
A Low Bit Instability CMOS PUF Based on Current Mirrors and WTA CellsMitchell-Moreno Joseph Herbert; Flores-Verdad Guillermo Espinosa20232023, vol.39, no.5/6
Detection Method of Hardware Trojan Based on Attention Mechanism and Residual-Dense-Block under the Markov Transition FieldChen Shouhong; Wang Tao; Huang Zhentao; Hou Xingna20232023, vol.39, no.5/6
Trade-off Mechanism Between Reliability and Performance for Data-flow Soft Error DetectionLu Yufan; Chen Xin; Zhao Zhenyu20232023, vol.39, no.5/6
Effective Software Mutation-Test Using Program Instructions ClassificationAsghari Zeinab; Arasteh Bahman; Koochari Abbas20232023, vol.39, no.5/6
MATLAB-Open Source Tool Based Framework for Test Generation for Digital Circuits Using Evolutionary AlgorithmsBhattacharya Priyajit; Bhattacharya Rahul; Deka Himasree20232023, vol.39, no.5/6
Test Technology Newsletter 20232023, vol.39, no.5/6
A Survey of PCB Defect Detection AlgorithmsLakshmi Gayathri; Sankar V. Udaya; Sankar Y. Siva20232023, vol.39, no.5/6
Efficient Fault Detection by Test Case Prioritization via Test Case SelectionRajasingh J. Paul; Kumar P. Senthil; Srinivasan S.20232023, vol.39, no.5/6
Identification of Unknown Electromagnetic Interference Sources Based on Siamese-CNNXiao Ying-Chun; Zhu Feng; Zhuang Shengxian; Yang Yang20232023, vol.39, no.5/6
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