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期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023

2023, vol.39, no.1 2023, vol.39, no.2 2023, vol.39, no.3 2023, vol.39, no.4

题名作者出版年年卷期
Test Technology Newsletter 20232023, vol.39, no.3
Investigation of Single Event Effects in a Resistive RAM Memory Array by Coupling TCAD and SPICE SimulationsCoulié K.; Aziza H.; Rahajandraibe W.20232023, vol.39, no.3
Incomplete Testing of SOCSingh Kunwer Mrityunjay; Deka Jatindra; Biswas Santosh20232023, vol.39, no.3
Multi-Objective Optimization Based Test Pattern Generation for Hardware Trojan DetectionRathor Vijaypal Singh; Singh Deepak; Singh Simranjit; Sajwan Mohit20232023, vol.39, no.3
BISCC: A Novel Approach to Built In State Consistency Checking For Quick Volume Validation of Mixed-Signal/RF SystemsDeyati Sabyasachi; Muldrey Barry; Chatterjee Abhijit20232023, vol.39, no.3
Low Overhead and High Stability Radiation-Hardened Latch for Double/Triple Node UpsetsHuang Zhengfeng; Wang Hao; Ma Dongxing; Liang Huaguo; Ouyang Yiming; Yan Aibin20232023, vol.39, no.3
EditorialAgrawal Vishwani D.20232023, vol.39, no.3
Modular Test Kit – A Modular Approach for Efficient and Function-Oriented TestingJoo? Benedikt; Schramm Dieter20232023, vol.39, no.3
A Novel Metaheuristic Based Method for Software Mutation Test Using the Discretized and Modified Forrest Optimization AlgorithmArasteh Bahman; Gharehchopogh Farhad Soleimanian; Gunes Peri; Kiani Farzad; Torkamanian-Afshar Mahsa20232023, vol.39, no.3
A Flexible Concurrent Testing Scheme for Non-Feedback and Feedback Bridging Faults in Integrated CircuitsBiswal Pradeep Kumar20232023, vol.39, no.3



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