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期刊


ISSN1084-4309
刊名ACM Transactions on Design Automation of Electronic Systems
参考译名ACM电子系统自动化设计汇刊
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2024, vol.29, no.1 2024, vol.29, no.2 2024, vol.29, no.3

题名作者出版年年卷期
Introduction to the Special Issue on Design for Testability and Reliability of Security-aware HardwareTianming Ni; Xiaoqing Wen; Hussam Amrouch; Cheng Zhuo; Peilin Song20242024, vol.29, no.1
An Efficient Ring Oscillator PUF Using Programmable Delay Units on FPGAYIJUN CUI; JIANG LI; YUNPENG CHEN; CHENGHUA WANG; CHONGYAN GU; MAIRE O'NEILL; WEIQIANG LIU20242024, vol.29, no.1
ProtFe: Low-Cost Secure Power Side-Channel Protection for General and Custom FeFET-Based MemoriesTAIXIN LI; BORAN SUN; HONGTAO ZHONG; YIXIN XU; VIJAYKRISHNAN NARAYANAN; LIANG SHI; TIANYI WANG; YAO YU; THOMAS KAMPFE; KAI NI; HUAZHONG YANG; XUEQING LI20242024, vol.29, no.1
On-chip ESD Protection Design Methodologies by CAD SimulationZIJIN PAN; XUNYU LI; WEIQUAN HAO; RUNYU MIAO; ALBERT WANG20242024, vol.29, no.1
A Reliability-Aware Splitting Duty-Cycle Physical Unclonable Function Based on Trade-off Process, Voltage, and Temperature VariationsJINGCHANG BIAN; ZHENGFENG HUANG; PENG YE; ZHAO YANG; HUAGUO LIANG20242024, vol.29, no.1
A High Throughput STR-based TRNG by Jitter Precise Quantization SuperposingYUAN ZHANG; JILIANG ZHANG20242024, vol.29, no.1
Test Compression for Launch-on-Capture Transition Fault TestingDONG XIANG20242024, vol.29, no.1
AD~2VNCS: Adversarial Defense and Device Variation-tolerance in Memristive Crossbar-based Neuromorphic Computing SystemsYONGTIAN BI; QI XU; HAO GENG; SONG CHEN; YI KANG20242024, vol.29, no.1
Heterogeneous Integration Supply Chain Integrity Through Blockchain and CHSMPAUL E. CALZADA; MD. SAMI UL ISLAM SAMI; KIMIA ZAMIRI AZAR; FAHIM RAHMAN; FARIMAH FARAHMANDI; MARK TEHRANIPOOR20242024, vol.29, no.1
The Resistance Analysis Attack and Security Enhancement of the IMC LUT Based on the Complementary Resistive Switch CellsXIAOLE CUI; MINGQI YIN; HANQING LIU; XIAOXIN CUI20242024, vol.29, no.1
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