中国机械工程学会生产工程分会知识服务平台

期刊


ISSN0957-0233
刊名Measurement Science & Technology
参考译名测量科学与技术
收藏年代1990~2013



全部

1990 1991 1992 1993 1999 2000
2001 2002 2003 2004 2005 2006
2007 2008 2009 2010 2011 2012
2013

2000, vol.11, no.1 2000, vol.11, no.10 2000, vol.11, no.11 2000, vol.11, no.12 2000, vol.11, no.2 2000, vol.11, no.3
2000, vol.11, no.4 2000, vol.11, no.5 2000, vol.11, no.6 2000, vol.11, no.7 2000, vol.11, no.8 2000, vol.11, no.9

题名作者出版年年卷期
A highly accurate iterative PIV technique using a gradient methodYasuhiko Sugii; Shigeru Nishio; Taketoshi Okuno; Koji Okamoto20002000, vol.11, no.12
A noise reduction technique for on-line detection and location of partial discharges in high voltage cable networksI. Shim; J. J. Soraghan; W. H. Siew20002000, vol.11, no.12
A novel high temperature NMR probe design: application to 17{sup left}O studies of gel formation of zirconiaI. J. F. Poplett; M. E. Smith; J. H. Strange20002000, vol.11, no.12
A remote acceptance probe and illumination configuration for spectral assessment of internal attributes of intact fruitColin V. Greensill; Kerry B. Walsh20002000, vol.11, no.12
An auger electron-threshold photoelectron coincidence spectrometer for studies of atomic and molecular dicationsYasumasa Hikosaka; Francis Penent; Pascal Lablanquie; Richard Hall; Kenji Ito20002000, vol.11, no.12
An error-model study of a new type of coordinate-measuring machine based on the parallel-link mechanismDejun Liu; Rensheng Che; Qingcheng Huang; Dong Ye20002000, vol.11, no.12
Angular profiles of molecular beams from effusive tube sources: I. experimentF. Rugamas; D. Roundy; G. Mikaelian; G. Vitug; M. Rudner; J. Shih; D. Smith; J. Segura; M. A. Khakoo20002000, vol.11, no.12
Compact optical trapping microscope using a diode laserZ. Ulanowski; I. K. Ludlow20002000, vol.11, no.12
Fast trace humidity generation in the 0.1 ppm to 1000 ppm range with a two-stage dilution and mixing generatorHolger Venzke; Bernd Schirmer; Martin Still; Adrian Melling; Franz Durst20002000, vol.11, no.12
Interferometric determination of the refractive index of liquid sulphur dioxideM. Musso; R. Aschauer; A. Asenbaum; C. Vasi; Emmerich Wilhelm20002000, vol.11, no.12
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