中国机械工程学会生产工程分会知识服务平台
主页
文献资源
外文期刊
外文会议
中文期刊
专业机构
生产工程
智能制造
高级检索
关于我们
版权声明
使用帮助
期刊
ISSN
0957-0233
刊名
Measurement Science & Technology
参考译名
测量科学与技术
收藏年代
1990~2013
全部
1990
1991
1992
1993
1999
2000
2001
2002
2003
2004
2005
2006
2007
2008
2009
2010
2011
2012
2013
2007, vol.18, no.1
2007, vol.18, no.10
2007, vol.18, no.11
2007, vol.18, no.12
2007, vol.18, no.2
2007, vol.18, no.3
2007, vol.18, no.4
2007, vol.18, no.5
2007, vol.18, no.6
2007, vol.18, no.7
2007, vol.18, no.8
2007, vol.18, no.9
题名
作者
出版年
年卷期
Ultraprecision micro-CMM using a low force 3D touch probe
A. Kung; F. Meli; R. Thalmann
2007
2007, vol.18, no.2
3D metrology with a compact scanning probe microscope based on self-sensing cantilever probes
C. Dal Savio; S. Dejima; H.-U. Danzebrink; T. Gotszalk
2007
2007, vol.18, no.2
Nanoscale surface measurements at sidewalls of nano- and micro-structures
Gaoliang Dai; Helmut Wolff; Thomas Weimann; Min Xu; Frank Pohlenz; Hans-Ulrich Danzebrink
2007
2007, vol.18, no.2
Two-dimensional encoder with picometre resolution using lattice spacing on regular crystalline surface as standard
Masato Aketagawa; Hiroshi Honda; Masashi Ishige; Chaikool Patamaporn
2007
2007, vol.18, no.2
An atomic force microscope for the study of the effects of tip-sample interactions on dimensional metrology
Andrew Yacoot; Ludger Koenders; Helmut Wolff
2007
2007, vol.18, no.2
Facility and methods for the measurement of micro and nano forces in the range below 10{sup}(-5) N with a resolution of 10{sup}(-12) N (development concept)
Vladimir Nesterov
2007
2007, vol.18, no.2
Method for linear measurements in the nanometre range
Yu. A. Novikov; Yu. V. Ozerin; A. V. Rakov; P. A. Todua
2007
2007, vol.18, no.2
Imaging laser diffractometer for traceable grating pitch calibration
R. Pekelsky; B. J. Eves; P. R. Nistico; J. E. Decker
2007
2007, vol.18, no.2
Increase of maximum detectable slope with optical profilers, through controlled tilting and image processing
F. Marinello; P. Bariani; A. Pasquini; L. De Chiffre; M. Bossard; G. B. Picotto
2007
2007, vol.18, no.2
Calibration strategies for scanning probe metrology
K. R. Koops; M. G. A. van Veghel; G. J. W. L. Kotte; M. C. Moolman
2007
2007, vol.18, no.2
1
2
3
国家科技图书文献中心
全球文献资源网
京ICP备05055788号-26
机械工业信息研究院 2018-2024