中国机械工程学会生产工程分会知识服务平台

期刊


ISSN0957-0233
刊名Measurement Science & Technology
参考译名测量科学与技术
收藏年代1990～2013



全部

1990 1991 1992 1993 1999 2000
2001 2002 2003 2004 2005 2006
2007 2008 2009 2010 2011 2012
2013

2009, vol.20, no.1 2009, vol.20, no.10 2009, vol.20, no.11 2009, vol.20, no.12 2009, vol.20, no.2 2009, vol.20, no.3
2009, vol.20, no.4 2009, vol.20, no.5 2009, vol.20, no.6 2009, vol.20, no.7 2009, vol.20, no.8 2009, vol.20, no.9

题名作者出版年年卷期
A high precision micro/nano CMM using piezoresistive tactile probesGaoliang Dai; Sebastian Butefisch; Frank Pohlenz; Hans-Ulrich Danzebrink20092009, vol.20, no.8
Coordinate metrology using scanning probe microscopesF. Marinello; E. Savio; P. Bariani; S. Carmignato20092009, vol.20, no.8
Design of a large measurement-volume metrological atomic force microscope (AFM)Brian J. Eves20092009, vol.20, no.8
Advanced three-dimensional scan methods in the nanopositioning and nanomeasuring machineT. Hausotte; B. Percle; G. Jager20092009, vol.20, no.8
A hybrid scanning probe microscope (SPM) module based on a DVD optical headE. T. Hwu; H. Illers; L. Jusko; H. U. Danzebrink20092009, vol.20, no.8
A two-dimensional atom encoder using one lateral-dithered scanning tunneling microscope (STM) tip and a regular crystalline latticePatamaporn Chaikool; Masato Aketagawa; Eiki Okuyama20092009, vol.20, no.8
Local probe microscopy with interferometric monitoring of the stage nanopositioningJ. Lazar; P. Klapetek; O. Cip; M. Cizek; M. Sery20092009, vol.20, no.8
A homodyne Michelson interferometer with sub-picometer resolutionMarco Pisani20092009, vol.20, no.8
Common path two-wavelength homodyne counting interferometer developmentPetr Kren; Petr Balling20092009, vol.20, no.8
A new high-aperture 193 nm microscope for the traceable dimensional characterization of micro- and nanostructuresG. Ehret; F. Pilarski; D. Bergmann; B. Bodermann; E. Buhr20092009, vol.20, no.8
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