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期刊
ISSN
0957-0233
刊名
Measurement Science & Technology
参考译名
测量科学与技术
收藏年代
1990~2013
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2010, vol.21, no.1
2010, vol.21, no.10
2010, vol.21, no.11
2010, vol.21, no.12
2010, vol.21, no.2
2010, vol.21, no.3
2010, vol.21, no.4
2010, vol.21, no.5
2010, vol.21, no.6
2010, vol.21, no.7
2010, vol.21, no.8
2010, vol.21, no.9
题名
作者
出版年
年卷期
Electric current sensors: a review
Pavel Ripka
2010
2010, vol.21, no.11
Biological and chemical sensors for cancer diagnosis
Elfriede Simon
2010
2010, vol.21, no.11
Interferometric determination of the topographies of absolute sphere radii using the sphere interferometer of PTB
Guido Bartl; Michael Krystek; Arnold Nicolaus; Walter Giardini
2010
2010, vol.21, no.11
Analog-to-digital conversion for low-frequency waveforms based on the Josephson voltage standard
Mun-Seog Kim; Kyu-Tae Kim; Wan-Seop Kim; Yonuk Chong; Sung-Won Kwon
2010
2010, vol.21, no.11
Heat-flow and temperature control in Tian-Calvet microcalorimeters: toward higher detection limits
L. E. Vilchiz-Bravo; A. Pacheco-Vega; B. E. Handy
2010
2010, vol.21, no.11
Removal of zero-point drift from AB data and the statistical cost
H. Erik Swanson; Stephan Schlamminger
2010
2010, vol.21, no.11
Direct measurement of surface shape for validation of indentation deformation and plasticity length-scale effects: a comparison of methods
X. D. Hou; A. J. Bushby; N. M. Jennett
2010
2010, vol.21, no.11
On the calibration of rectangular atomic force microscope cantilevers modified by particle attachment and lamination
James Bowen; David Cheneler; Dominic Walliman; Stuart G. Arkless; Zhibing Zhang; Michael C. L. Ward; Michael J. Adams
2010
2010, vol.21, no.11
Modeling the integration between specifications and verification for cylindricity based on category theory
Wenlong Lu; Xiangqian Jiang; Xiaojun Liu; Qunfen Qi; P. Scott
2010
2010, vol.21, no.11
Quantitative assessment of slit Mura defect in a thin film transistor-liquid crystal display based on chromaticity and optical density
Fu-Ming Tzu; Jung-Hua Chou
2010
2010, vol.21, no.11
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