中国机械工程学会生产工程分会知识服务平台

期刊


ISSN0957-0233
刊名Measurement Science & Technology
参考译名测量科学与技术
收藏年代1990～2013



全部

1990 1991 1992 1993 1999 2000
2001 2002 2003 2004 2005 2006
2007 2008 2009 2010 2011 2012
2013

2012, vol.23, no.1 2012, vol.23, no.10 2012, vol.23, no.11 2012, vol.23, no.12 2012, vol.23, no.2 2012, vol.23, no.3
2012, vol.23, no.4 2012, vol.23, no.5 2012, vol.23, no.6 2012, vol.23, no.7 2012, vol.23, no.9

题名作者出版年年卷期
Calibration of a microprobe arrayChristian Schrader; Rainer Tutsch20122012, vol.23, no.5
A new micro/nano displacement measurement method based on a double-fiber Bragg grating (FBG) sensing structureFangfang Liu; Yetai Fei; Haojie Xia; Lijuan Chen20122012, vol.23, no.5
A new method for high-accuracy gauge block measurement using 2 GHz repetition mode of a mode-locked fiber laserNarin Chanthawong; Satoru Takahashi; Kiyoshi Takamasu; Hirokazu Matsumoto20122012, vol.23, no.5
Analysis of technical requirements and the self-modification method for a combinatorial code grating eddy-current absolute-position sensorWeiwen Liu; Hui Zhao; Wei Tao; Chunfeng Lv; Hongli Qi20122012, vol.23, no.5
A task specific uncertainty analysis method for least-squares-based form characterization of ultra-precision freeform surfacesM. J. Ren; C. F. Cheung; L. B. Kong20122012, vol.23, no.5
A comparison of sensitivity standards in form metrology - final results of the EURAMET project 649Otto Jusko; Harald Bosse; David Flack; Bjorn Hemming; Marco Pisani; Ruedi Thalmann20122012, vol.23, no.5
Influence of standing wave phase error on super-resolution optical inspection for periodic microstructuresR. Kudo; S. Usuki; S. Takahashi; K. Takamasu20122012, vol.23, no.5
Picometre and nanoradian heterodyne interferometry and its application in dilatometry and surface metrologyT. Schuldt; M. Gohlke; H. Kogel; R. Spannagel; A. Peters; U. Johann; D. Weise; C. Braxmaier20122012, vol.23, no.5
Advantages of chromatic-confocal spectral interferometry in comparison to chromatic confocal microscopyW. Lyda; M. Gronle; D. Fleischle; F. Mauch; W. Osten20122012, vol.23, no.5
Development of ballistics identification-from image comparison to topography measurement in surface metrologyJ Song; W. Chu; T. V. Vorburger; R. Thompson; T. B. Renegar; A. Zheng; J. Yen; R. Silver; M. Ols20122012, vol.23, no.5
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