中国机械工程学会生产工程分会知识服务平台

期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



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2006, vol.22, no.1 2006, vol.22, no.2 2006, vol.22, no.3 2006, vol.22, no.4-6

题名作者出版年年卷期
A Low-Cost Jitter Measurement Technique for BIST ApplicationsJIUN-LANG HUANG; JUI-JER HUANG; YUAN-SHUANG LIU20062006, vol.22, no.3
A Novel RF Test Scheme Based on a DFT MethodJEE-YOUL RYU; BRUCE C. KIM; IBOUN SYLLA20062006, vol.22, no.3
An Automated BIST Architecture for Testing and Diagnosing FPGA Interconnect FaultsJACK SMITH; TIAN XIA; CHARLES STROUD20062006, vol.22, no.3
Defect Simulation Methodology for I{sub}(DDT) TestingABHISHEK SINGH; JIM PLUSQUELLIC; DHANANJAY PHATAK; CHINTAN PATEL20062006, vol.22, no.3
Observability Statement Coverage Based on Dynamic Factored Use-Definition Chains for Functional VerificationTAO LV; JIAN-PING FAN; XIAO-WEI LI; LING-YI LIU20062006, vol.22, no.3
ADOFs and Resistive-ADOFs in SRAM Address Decoders: Test Conditions and March SolutionsLUIGI DILILLO; PATRICK GIRARD; SERGE PRAVOSSOUDOVITCH; ARNAUD VIRAZEL; SIMONE BORRI; MAGALI HAGE-HASSAN20062006, vol.22, no.3
Combining Scan Test and Built-in Self TestMARKUS SEURING20062006, vol.22, no.3
Security Extension for IEEE Std 1149.1FRANC NOVAK; ANTON BIASIZZO20062006, vol.22, no.3



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