中国机械工程学会生产工程分会知识服务平台

期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志:理论与应用
收藏年代2000~2023



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2019, vol.35, no.1 2019, vol.35, no.2 2019, vol.35, no.3 2019, vol.35, no.4 2019, vol.35, no.5 2019, vol.35, no.6

题名作者出版年年卷期
Characterization Method for Integrated Magnetic Devices at Lower Frequencies (up to 110MHz)Oumar, D. A.; Boukhari, M. I.; Taha, M. A.; Capraro, S.; Pietroy, D.; Chatelon, J. P.; Rousseau, J. J.20192019, vol.35, no.2
Single Event Transient Propagation Probabilities Analysis for Nanometer CMOS CircuitsHe, Binyong; Yu, Fei; Cai, Shuo; Wang, Weizheng20192019, vol.35, no.2
Impact of Bias Temperature Instability (BTI) Aging Phenomenon on Clock Deskew BuffersGrossi, Marco; Omana, Martin20192019, vol.35, no.2
Testing of Current Carrying Capacity of Conducting Tracks in High Power Flexible Printed Circuit BoardsKumar, Remesh K. R.; Kumar, K. Shreekrishna20192019, vol.35, no.2
Evaluating the Impact of Temperature on Dynamic Fault Behaviour of FinFET-Based SRAMs with Resistive DefectsCardoso Medeiros, G.; Brum, E.; Bolzani Poehls, L.; Copetti, T.; Balen, T.20192019, vol.35, no.2
Memory-Aware Design Space Exploration for Reliability Evaluation in Computing SystemsKooli, Maha; Di Natale, Giorgio; Bosio, Alberto20192019, vol.35, no.2
A Unified Approach to Detect and Distinguish Hardware Trojans and Faults in SRAM-based FPGAsPooyan, Fatemeh; Asadi, Hossein; Ranjbar, Omid; Bayat-Sarmadi, Siavash20192019, vol.35, no.2
Low-Cost Strategy for Bus Propagation Delay ReductionOmana, M.; Govindaraj, S.; Metra, C.20192019, vol.35, no.2
A Low-Cost Test Solution for Reliable Communication in Networks-on-ChipBhowmik, Biswajit; Biswas, Santosh; Deka, Jatindra Kumar; Bhattacharya, Bhargab B.20192019, vol.35, no.2
An Integrated on-Silicon Verification Method for FPGA OverlaysKourfali, Alexandra; Fricke, Florian; Huebner, Michael; Stroobandt, Dirk20192019, vol.35, no.2
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