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期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



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2024

2009, vol.25, no.1 2009, vol.25, no.2/3 2009, vol.25, no.4/5 2009, vol.25, no.6

题名作者出版年年卷期
Critical Path Selection for Delay Testing Considering Coupling NoiseRajeshwary Tayade; Jacob A. Abraham20092009, vol.25, no.4/5
Fault Detection Structures of the S-boxes and the Inverse S-boxes for the Advanced Encryption StandardMehran Mozaffari-Kermani; Arash Reyhani-Masoleh20092009, vol.25, no.4/5
X-tolerant Test Data Compaction with Accelerated Shift RegistersMartin Hilscher; Michael Braun; Michael Richter; Andreas Leininger; Michael Gossel20092009, vol.25, no.4/5
Adaptive Debug and Diagnosis Without Fault DictionariesStefan Hoist; Hans-Joachim Wunderlich20092009, vol.25, no.4/5
A Reliable Architecture for Parallel Implementations of the Advanced Encryption StandardG. Di Natale; M. Doulcier; M. L. Flottes; B. Rouzeyre20092009, vol.25, no.4/5
A Modified Charge Pumping Method for Measuring Interface States Up to the Ghz RangeR. Fernandez20092009, vol.25, no.4/5



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