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期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



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2009, vol.25, no.1 2009, vol.25, no.2/3 2009, vol.25, no.4/5 2009, vol.25, no.6

题名作者出版年年卷期
An Efficient Framework for Scalable Defect Isolation in Large Scale Networks of DNA Self-AssemblyMasaru Fukushi; Susumu Horiguchi; Luke Demoracski; Fabrizio Lombardi20092009, vol.25, no.1
Healing DNA Self-Assemblies Using PuncturesMasoud Hashempour; Zahra Mashreghian Arani; Fabrizio Lombardi20092009, vol.25, no.1
Detecting Multiple Faults in One-Dimensional Arrays of Reversible QCA GatesXiaojun Ma; Jing Huang; Cecilia Metra; Fabrizio Lombardi20092009, vol.25, no.1
Modeling and Evaluating Errors Due to Random Clock Shifts in Quantum-Dot Cellular Automata CircuitsFaizal Karim; Marco Ottavi; Hamidreza Hashempour; Vamsi Vankamamidi; Konrad Walus; Andre Ivanov; Fabrizio Lombardi20092009, vol.25, no.1
A Layout Sensitivity Model for Estimating Electromigration-vulnerable Narrow InterconnectsRani S. Ghaida; Payman Zarkesh-Ha20092009, vol.25, no.1
How Many Test Vectors We Need to Detect a Bridging Fault?Michele Favalli; Marcello Dalpasso20092009, vol.25, no.1
Test Compression for IP Core Testing with Reconfigurable Network and Fixing-Flipping CodingKazuteru Namba; Yoshikazu Matsui; Hideo Ito20092009, vol.25, no.1
SET Emulation Under a Quantized Delay ModelMario Garcia Valderas; Luis Entrena; Raul Fernandez Cardenal; Celia Lopez Ongil; Marta Portela Garcia20092009, vol.25, no.1
Design for Test of Asynchronous NULL Convention Logic (NCL) CircuitsWaleed K. Al-Assadi; Sindhu Kakarla20092009, vol.25, no.1



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