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期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



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2009, vol.25, no.1 2009, vol.25, no.2/3 2009, vol.25, no.4/5 2009, vol.25, no.6

题名作者出版年年卷期
A SPICE-Like 2T-FLOTOX Core-Cell Model for Defect Injection and Faulty Behavior Prediction in eFlashO. Ginez; J.-M. Daga; P. Girard; C. Landrault; S. Pravossoudovitch; A. Virazel20092009, vol.25, no.2/3
A Built-in-Self-Test E-A ADC PrototypeHao-Chiao Hong; Sheng-Chuan Liang; Hong-Chin Song20092009, vol.25, no.2/3
Test Points Selection for Analog Fault Dictionary TechniquesChenglin Yang; Shulin Tian; Bing Long20092009, vol.25, no.2/3
A Novel Fault Localization Technique Based on Deconvolution and Calibration of Power Pad Transients SignalsReza M. Rad; Jim Plusquellic20092009, vol.25, no.2/3
A New Algorithm for the Selection of Control Cells in Boundary-Scan Interconnect TestA. Quiros-Olozabal; M. A. Cifredo-Chacon20092009, vol.25, no.2/3
Soft Error Rate Reduction Using Circuit Optimization and Transient Filter InsertionMihir R. Choudhury; Quming Zhou; Kartik Mohanram20092009, vol.25, no.2/3



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