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期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



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2024

2009, vol.25, no.1 2009, vol.25, no.2/3 2009, vol.25, no.4/5 2009, vol.25, no.6

题名作者出版年年卷期
Utilizing On-chip Resources for Testing Embedded Mixed-signal CoresCarsten Wegener; Heinz Mattes; Stephane Kirmser; Frank Demmerle; Sebastian Sattler20092009, vol.25, no.6
Low-Area Wrapper Cell Design for Hierarchical SoC TestingKyuchull Kim; Kewal K. Saluja20092009, vol.25, no.6
PSL Assertion Checking Using Temporally Extended High-Level Decision DiagramsMaksim Jenihhin; Jaan Raik; Anton Chepurov; Raimund Ubar20092009, vol.25, no.6
LPTest: a Flexible Low-Power Test Pattern GeneratorMeng-Fan Wu; Kai-Shun Hu; Jiun-Lang Huang20092009, vol.25, no.6
A Better Method than Tail-fitting Algorithm for Jitter Separation Based on Gaussian Mixture ModelFangyuan Nan; Yaonan Wang; Fuhai Li; Weifeng Yang; Xiaoping Ma20092009, vol.25, no.6
On Boosting the Accuracy of Non-RF to RF Correlation-Based Specification Test CompactionNathan Kupp; Petros Drineas; Mustapha Slamani; Yiorgos Makris20092009, vol.25, no.6
On Built-in Self-Test for AddersMary D. Pulukuri; Charles E. Stroud20092009, vol.25, no.6



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