中国机械工程学会生产工程分会知识服务平台

期刊


ISSN1043-7398
刊名Journal of Electronic Packaging
参考译名电子封装杂志;美国机械工程师学会汇刊
收藏年代1995~2024



全部

1995 1996 1997 1998 1999 2000
2001 2002 2003 2004 2005 2006
2007 2008 2009 2010 2011 2012
2013 2014 2015 2016 2017 2018
2019 2020 2021 2022 2023 2024

2018, vol.140, no.1 2018, vol.140, no.2 2018, vol.140, no.3 2018, vol.140, no.4

题名作者出版年年卷期
Impact of Tile Design on the Thermal Performance of Open and Enclosed AislesKhalili, Sadegh; Tradat, Mohammad I.; Nemati, Kourosh; Seymour, Mark; Sammakia, Bahgat20182018, vol.140, no.1
Lead-Free Alternatives for Interconnects in High-Temperature ElectronicsMallampati, Sandeep; Yin, Liang; Shaddock, David; Schoeller, Harry; Cho, Junghyun20182018, vol.140, no.1
Experimentally Validated Computational Fluid Dynamics Model for Data Center With Active TilesAthavale, Jayati; Joshi, Yogendra; Yoda, Minami20182018, vol.140, no.1
Application-Driven Reliability Research of Next Generation for Automotive Electronics: Challenges and ApproachesRzepka, Sven; Otto, Alexander; Vogel, Dietmar; Dudek, Rainer20182018, vol.140, no.1
Role of a Liquid Accumulator in a Passive Two-Phase Liquid Cooling System for Electronics: Experimental AnalysisLamaison, Nicolas; Amalfi, Raffaele L.; Salamon, Todd; Marcinichen, Jackson B.; Thome, John R.20182018, vol.140, no.1
Four-Wire Bridge Measurements of Silicon van der Pauw Stress Sensors (vol 136, 041014, 2014)Jaeger, Richard C.; Motalab, Mohammad; Hussain, Safina; Suhling, Jeffrey C.20182018, vol.140, no.1
Special Section on InterPACK 2017-Part 1Mysore, Kaushik; Narumanchi, Sreekant; Dede, Ercan; Khiabani, Reza20182018, vol.140, no.1
Improvement of Thermo-Mechanical Reliability of Wafer-Level Chip Scale PackagingShi, Lei; Chen, Lin; Zhang, David Wei; Liu, Evan; Liu, Qiang; Chen, Ching-I20182018, vol.140, no.1
Thermal Metamaterials for Heat Flow Control in ElectronicsDede, Ercan M.; Zhou, Feng; Schmalenberg, Paul; Nomura, Tsuyoshi20182018, vol.140, no.1
Ripening Growth Kinetics of Cu6Sn5 Grains in Sn-3.0Ag-0.5Cu-xTiO(2)/Cu Solder Joints During the Reflow ProcessTang, Y.; Luo, S. M.; Li, G. Y.; Yang, Z.; Hou, C. J.20182018, vol.140, no.1
12