中国机械工程学会生产工程分会知识服务平台

期刊


ISSN0957-0233
刊名Measurement Science & Technology
参考译名测量科学与技术
收藏年代1990～2013



全部

1990 1991 1992 1993 1999 2000
2001 2002 2003 2004 2005 2006
2007 2008 2009 2010 2011 2012
2013

2011, vol.22, no.1 2011, vol.22, no.10 2011, vol.22, no.11 2011, vol.22, no.12 2011, vol.22, no.2 2011, vol.22, no.4
2011, vol.22, no.5 2011, vol.22, no.6 2011, vol.22, no.7 2011, vol.22, no.8 2011, vol.22, no.9

题名作者出版年年卷期
Scanning probe microscope dimensional metrology at NISTJohn A. Kramar; Ronald Dixson; Ndubuisi G. Orji20112011, vol.22, no.2
Nanometrology using a through-focus scanning optical microscopy methodRavikiran Attota; Richard Silver20112011, vol.22, no.2
Characterizing a scatterfield optical platform for semiconductor metrologyB. M. Barnes; R. Attota; R. Quintanilha; Y. J. Sohn; R. M. Silver20112011, vol.22, no.2
Review of current progress in nanometrology with the helium ion microscopeMichael T. Postek; Andras Vladar; Charles Archie; Bin Ming20112011, vol.22, no.2
Development of the metrology and imaging of cellulose nanocrystalsMichael T. Postek; Andras Vladar; John Dagata; Natalia Farkas; Bin Ming; Ryan Wagner; Arvind Raman; Robert J. Moon; Ronald Sabo; Theodore H. Wegner; James Beecher20112011, vol.22, no.2
Combined scanning probe and light scattering characterization of multi-stage self-assembly of targeted liposome-based delivery systemsN. Farkas; J. A. Dagata; C. Yang; A. Rait; K. F. Pirollo; E. H. Chang20112011, vol.22, no.2
The determination of the thickness of the silicon oxide film by synchrotron radiation X-ray photoelectron spectroscopy (SR-XPS) analysisM. Imamura; N. Matsubayashi; J. Fan; I. Kojima; M. Sasaki20112011, vol.22, no.2
Determination of the pore size distribution and porosity of porous low-dielectric-constant films by grazing incidence X-ray scatteringY. Ito; K. Omote20112011, vol.22, no.2
Evaluation of uncertainties in femtoampere current measurement for the number concentration standard of aerosol nanoparticlesHiromu Sakurai; Kensei Ehara20112011, vol.22, no.2
Primary standard for the number concentration of liquid-borne particles in the 10 to 20 μm diameter rangeT. Sakaguchi; K. Ehara20112011, vol.22, no.2
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