中国机械工程学会生产工程分会知识服务平台

期刊


ISSN0957-0233
刊名Measurement Science & Technology
参考译名测量科学与技术
收藏年代1990～2013



全部

1990 1991 1992 1993 1999 2000
2001 2002 2003 2004 2005 2006
2007 2008 2009 2010 2011 2012
2013

2011, vol.22, no.1 2011, vol.22, no.10 2011, vol.22, no.11 2011, vol.22, no.12 2011, vol.22, no.2 2011, vol.22, no.4
2011, vol.22, no.5 2011, vol.22, no.6 2011, vol.22, no.7 2011, vol.22, no.8 2011, vol.22, no.9

题名作者出版年年卷期
Diameter measurements of polystyrene particles with atomic force microscopyJ. Garnaes20112011, vol.22, no.9
Traceable measurement of nanoparticle size using a scanning electron microscope in transmission mode (TSEM)T. Klein; E. Buhr; K. P. Johnsen; C. G. Frase20112011, vol.22, no.9
Current limitations of SEM and AFM metrology for the characterization of 3D nanostructuresWolfgang Hassler-Grohne; Dorothee Huser; Klaus-Peter Johnsen; Carl Georg Frase; Harald Bosse20112011, vol.22, no.9
Modelling and simulating scanning force microscopes for estimating measurement uncertainty: a virtual scanning force microscopeMin Xu; Thorsten Dziomba; Ludger Koenders20112011, vol.22, no.9
Direct measurement and control of peak tapping forces in atomic force microscopy for improved height measurementsAndrzej Sikora; Lukasz Bednarz20112011, vol.22, no.9
Investigation of the cantilever response of non-contact atomic force microscopy for topography measurements in all three dimensionsWolfgang Hassler-Grohne; Dorothee Huser; Gaoliang Dai; Rainer Koning; Harald Bosse20112011, vol.22, no.9
Traceable measurements of small forces and local mechanical propertiesAnna Campbellova; Miroslav Valtr; Jaroslav Zuda; Petr Klapetek20112011, vol.22, no.9
Light-induced attractive force between two metal bodies separated by a subwavelength slitVladimir Nesterov; Leonid Frumin20112011, vol.22, no.9
Development of a 3D-AFM for true 3D measurements of nanostructuresGaoliang Dai; Wolfgang Hassler-Grohne; Dorothee Huser; Helmut Wolff; Hans-Ulrich Danzebrink; Ludger Koenders; Harald Bosse20112011, vol.22, no.9
Development of a metrological atomic force microscope with minimized Abbe error and differential interferometer-based real-time position controlSebastien Ducourtieux; Benoit Poyet20112011, vol.22, no.9
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