中国机械工程学会生产工程分会知识服务平台

期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



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2005, vol.21, no.1 2005, vol.21, no.2 2005, vol.21, no.3 2005, vol.21, no.4 2005, vol.21, no.5 2005, vol.21, no.6

题名作者出版年年卷期
Fault Modeling and Simulation of Power Supply Voltage Transients in Digital Systems on a ChipD. BARROS JUNIOR; M. RODRIGUEZ-IRAGO; M. B. SANTOS; I. C. TEIXEIRA; F. VARGAS; J. P. TEIXEIRA20052005, vol.21, no.4
Combined Fault Classification and Error Propagation Analysis to Refine RT-Level Dependability EvaluationA. AMMARI; K. HADJIAT; R. LEVEUGLE20052005, vol.21, no.4
Self-Checking Voter for High Speed TMR SystemsJOSE MANUEL CAZEAUX; DANIELE ROSSI; CECILIA METRA20052005, vol.21, no.4
Single- and Double-Output Embedded Checker Architectures for Systematic Unordered CodesSTEFFEN TARNICK20052005, vol.21, no.4
The Integration of On-Line Monitoring and Reconfiguration Functions into a Safety Critical Automotive Electronic Control UnitC. JEFFREY; R. CUTAJAR; A. RICHARDSON; S. PROSSER; M. LICKESS; S. RICHES20052005, vol.21, no.4
Low Cost On-Line Testing Strategy for RF CircuitsMARCELO NEGREIROS; LUIGI CARRO; ALTAMIRO A. SUSIN20052005, vol.21, no.4
A Comparative Evaluation of Designs for Reliable Memory SystemsG. C. CARDARILLI; F. LOMBARDI; M. OTTAVI; S. PONTARELLI; M. RE; A. SALSANO20052005, vol.21, no.4
Tolerance Architectures for NanotechnologiesMICHAEL NICOLAIDIS; LORENA ANGHEL; NADIR ACHOURI20052005, vol.21, no.4



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