中国机械工程学会生产工程分会知识服务平台

期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



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2005, vol.21, no.1 2005, vol.21, no.2 2005, vol.21, no.3 2005, vol.21, no.4 2005, vol.21, no.5 2005, vol.21, no.6

题名作者出版年年卷期
Low-Cost Testing of 5 GHz Low Noise Amplifiers Using New RF BIST CircuitJEE-YOUL RYU; BRUCE C. KIM20052005, vol.21, no.6
Fault Detection in Switched Current Circuits Using Built-in Transient Current SensorsY. LECHUGA; R. MOZUELOS; M. A. ALLENDE; M. MARTINEZ; S. BRACHO20052005, vol.21, no.6
Multiple-Constraint Driven System-on-Chip Test Time OptimizationJULIEN POUGET; ERIK LARSSON; ZEBO PENG20052005, vol.21, no.6
Reducing Scan Shifts Using Configurations of Compatible and Folding Scan TreesH. YOTSUYANAGI; T. KUCHII; S. NISHIKAWA; M. HASHIZUME; K. KINOSHITA20052005, vol.21, no.6
A Realistic Timing Test Model and Its Applications in High-Speed Interconnect DevicesBAOSHENG WANG; ANDY KUO; TOURAJ FARAHMAND; ANDRE IVANOV; YONG B. CHO; SASSAN TABATABAEI20052005, vol.21, no.6
The Coupling Model for Function and Delay FaultsJOONHWAN YI; JOHN P. HAYES20052005, vol.21, no.6
Abort-on-Fail Based Test SchedulingERIK LARSSON; JULIEN POUGET; ZEBO PENG20052005, vol.21, no.6



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