中国机械工程学会生产工程分会知识服务平台

期刊


ISSN0913-5685
刊名電子情報通信学会技術研究報告
参考译名电子信息通信学会技术研究报告：可靠性
收藏年代2000～2023



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023

2000, vol.100, no.140 2000, vol.100, no.313 2000, vol.100, no.377 2000, vol.100, no.445 2000, vol.100, no.524 2000, vol.100, no.623
2000, vol.100, no.66 2000, vol.100, no.706

题名作者出版年年卷期
Positive bias temperature instability of p{sup}+ polysilicon gated pMOSFETsTadayuki Nakajima; Masahiro Fujimoto; Shinji Nakano; Ichiro Matsuo20002000, vol.100, no.445
Ht carrier degradation of p{sup}+ polysilicon gated pMOSFETsM. Fujimoto; T. Nakajima; S. Nakano20002000, vol.100, no.445
Failure analysis system using extraction of killer function failure that has impact on yieldFumihito Ohta; Yasukazu Mukogawa; Kouji Fukumoto; Youji Mashiko20002000, vol.100, no.445
Securing the reliability in development of roof-integrated PV module: the fireproof performance and the waterproof performanceKomamine Tatsuya; Sugita Jun; Shono Hiroaki20002000, vol.100, no.445
Availability of systems with self-diagnostic componentsTieling Zhang; Wei Long; Koichi Suyama; Yoshinobu Sato20002000, vol.100, no.445



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