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2000, vol.100, no.140	2000, vol.100, no.313	2000, vol.100, no.377	2000, vol.100, no.445	2000, vol.100, no.524	2000, vol.100, no.623
2000, vol.100, no.66	2000, vol.100, no.706

题名	作者	出版年	年卷期
Characteristics and long-term reliability of silica-based thermo-optic switch modules	T. Goh; M. Okuno; Y. Hibino	2000	2000, vol.100, no.706
Study of chip durability structure of contactless IC cards	Nobuhiro Shimoyama; Hideyuki Unno; Tadao Takeda	2000	2000, vol.100, no.706
Sample preparation technique for failure analysis	Shinji Nakamura; Shigeru Nakajima	2000	2000, vol.100, no.706
Safety integrity levels model for safety-related systems with automatic diagnoses	Takuya Kawahara; Akihiro Ichitsuka; Yoshinobu Sato; Wei Long	2000	2000, vol.100, no.706