中国机械工程学会生产工程分会知识服务平台

期刊


ISSN0913-5685
刊名電子情報通信学会技術研究報告
参考译名电子信息通信学会技术研究报告:可靠性
收藏年代2000~2024



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题名作者出版年年卷期
Impacts of Channel Doping on Random Telegraph Signal Noise and Successful Noise Suppression by Mobility EnhancementJ. Chen; Y. Higashi; I. Hirano; Y. Mitani20132013, vol.113, no.296
2013 SISPADレビュー~輸送,信頼性森伸也20132013, vol.113, no.296
低温RTAにおけるSi中のSの挙動とS2形成の原子レベルシミュレーション金村貴永; 加藤弘一; 谷本弘吉; 青木伸俊; 豊島義明20132013, vol.113, no.296
窒化シリコン中の窒素空孔に導入された元素が電子トラップ準位に与える影響園田賢一郎; 佃栄次; 谷沢元昭; 石川清志; 山口泰男20132013, vol.113, no.296
シリコントライゲートナノワイヤトランジスタの低周波ノイズ特性解析齋藤真澄; 太田健介; 田中千加; 沼田敏典20132013, vol.113, no.296
量子エネルギー輸送モデルを用いた先端MOSFETシミュレーション鍾菁廣; 小田中紳二20132013, vol.113, no.296
シリコンナノワイヤトランジスタの解析的ドレイン電流モデルとデバイス設計田中千加; 萩島大輔; 内田建; 沼田敏典20132013, vol.113, no.296
DIBL効果を取り入れた弾道·準弾道GAA-MOSFSETのコンパクトモデル程賀; 宇野重康; 中里和郎20132013, vol.113, no.296
Pt/TiO_2/Pt系の抵抗変化現象の物理モデルとシミュレーションによる検証大村泰久; 近藤祐介20132013, vol.113, no.296
Double-gate Lateral Tunnel FETのデバイスモデル大村泰久; 佐藤大貴; 佐藤伸吾; Abhijit Mallik20132013, vol.113, no.296
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