中国机械工程学会生产工程分会知识服务平台

期刊


ISSN0734-2101
刊名Journal of Vacuum Science & Technology
参考译名真空科学与技术,A辑:真空、表面与膜
收藏年代2000~2013



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013

2010, vol.28, no.1 2010, vol.28, no.2 2010, vol.28, no.3 2010, vol.28, no.4 2010, vol.28, no.5 2010, vol.28, no.6

题名作者出版年年卷期
Microstructured optical fiber UHV integration for cold-atom experimentsJ. F. Clement; T. Vitse; P. Szriftgiser20102010, vol.28, no.6
Novel method for cleaning a vacuum chamber from hydrocarbon contaminationH. D. Wanzenboeck; P. Roediger; G. Hochleitner; E. Bertagnolli; W. Buehler20102010, vol.28, no.6
Comparison of Ti-Zr-V nonevaporable getter films deposited using alloy or twisted wire sputter-targetsR. Valizadeh; O. B. Malyshev; J. S. Colligon; A. Hannah; V. M. Vishnyakov20102010, vol.28, no.6
Study of the effect of plasma-striking atmosphere on Fe-oxidation in thermal dc arc-plasma processingI. Banerjee; Y. B. Khollam; S. K. Mahapatra; A. K. Das; S. V. Bhoraskar20102010, vol.28, no.6
Impact of the gas-surface scattering and gas molecule-molecule interaction on the mass flow rate of the rarefied gas through a short channel into a vacuumO. Sazhin20102010, vol.28, no.6
Structural and optical properties of yttrium oxide thin films for planar waveguiding applicationsStuart J. Pearce; Greg J. Parker; Martin D. B. Charlton; James S. Wilkinson20102010, vol.28, no.6
Aluminum recycling from reactor walls: A source of contamination in a-Si:H thin filmsC. Longeaud; P. P. Ray; A. Bhaduri; D. Daineka; E. V. Johnson; P. Roca i Cabarrocas20102010, vol.28, no.6
Effect of sample bias on backscattered ion spectroscopy in the helium ion microscopeG. Behan; J. F. Feng; H. Z. Zhang; P. N. Nirmalraj; J. J. Boland20102010, vol.28, no.6
Isolation of exchange- and spin-orbit-driven effects via manipulation of the axis of quantizationTakashi Komesu; G. D. Waddill; S. W. Yu; M. T. Butterfield; J. G. Tobin20102010, vol.28, no.6
Influence of strain on the hexagonal motifs of the Ir(100) surface reconstructions: A first-principles studyW. S. Su; F. C. Chuang; K. M. Lin; T. C. Leung20102010, vol.28, no.6
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