中国机械工程学会生产工程分会知识服务平台

期刊


ISSN0734-2101
刊名Journal of Vacuum Science & Technology
参考译名真空科学与技术，A辑：真空、表面与膜
收藏年代2000～2013



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013

2012, vol.30, no.1 2012, vol.30, no.2 2012, vol.30, no.3 2012, vol.30, no.4 2012, vol.30, no.5 2012, vol.30, no.6

题名作者出版年年卷期
Elaboration of high aspect ratio monocrystalline silicon suspended nanobridges by low temperature alkaline treatment of dry etched trenchesThomas Defforge; Gael Gautier; Thomas Tillocher; Remi Dussart; Francois Tran-Van20122012, vol.30, no.1
Atomic layer deposition for nanostructured Li-ion batteriesH. C. M. Knoops; M. E. Donders; M. C. M. van de Sanden; P. H. L. Notten; W. M. M. Kessels20122012, vol.30, no.1
Spatial atomic layer deposition: A route towards further industrialization of atomic layer depositionPaul Poodt; David C. Cameron; Eric Dickey; Steven M. George; Vladimir Kuznetsov; Gregory N. Parsons; Fred Roozeboom; Ganesh Sundaram; Ad Vermeer20122012, vol.30, no.1
Atomic layer deposition for electrochemical energy generation and storage systemsQing Peng; Jay S. Lewis; Paul G. Hoertz; Jeffrey T. Glass; Gregory N. Parsons20122012, vol.30, no.1
Impact of CdSe/ZnS quantum dot spectrum converters on InGaP/GaAs/Ge multi-junction solar cellsChun-Yuan Huang20122012, vol.30, no.1
Spatially resolved study of primary electron transport in magnetic cuspsAimee A. Hubble; John E. Foster20122012, vol.30, no.1
Power effect of ZnO:Al film as back reflector on the performance of thin-film solar cellsYang-Shih Lin; Shui-Yang Lien; Chao-Chun Wang; Chueh-Yang Liu; Asheesh Nautiyal; Dong-Sing Wuu; Pi-Chuen Tsai; Chia-Fu Chen; Shuo-Jen Lee20122012, vol.30, no.1
Substrate grain size and orientation of Cu and Cu-Ni foils used for the growth of graphene filmsZachary R. Robinson; Parul Tyagi; Thomas M. Murray; Carl A. Ventrice; Shanshan Chen; Andrew Munson; Carl W. Magnuson; Rodney S. Ruoff20122012, vol.30, no.1
Energy calibrations in the X-ray absorption spectroscopy of uranium dioxideSung Woo Yu; J. G. Tobin; Paul Olalde-Velasco; Wan Li Yang; Wigbert J. Siekhaus20122012, vol.30, no.1
Probing compositional disorder in vanadium oxide thin films grown on atomic layer deposited hafnia on silicon by capacitance spectroscopyChanghyun Ko; You Zhou; Shriram Ramanathan20122012, vol.30, no.1
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